100pcs P50‑J1P50‑B1P75‑B1P75‑E2P100‑E2 Spring Test Probe Round

About this item

• Features: Spring test probes are necessary parts for PCB testing to access components on printed circuit assemblies. There are total 100 pcs spring test probes in one set that you can use for a long time. Cone shape head can be used for testing throughhole components. Widely used for testing PCB gold fingers(edge connectors) and pads. They are great replacement probes if you need to change broken or old test probes. Specification: P75E2: head Shape: Cone Current Rating: 3A Resistance: 50m Ohm Stroke: 6.5mm head Diameter: 1.5mm Probe Tube Diameter: 1.36mm Probe Rod Diameter: 0.99mm Probe Length: 33.3mm Boring Size: 1.7mm Min. Test Interval: 2.54mm Quantity: 100pcs P50J1: head Shape: Round Current Rating: 3A Resistance: 50m Ohm Stroke: 2.6mm Probe Tube Diameter: 0.68mm Probe Rod Diameter: 0.48mm Probe Length: 16mm Boring Size: 0.9mm Min. Test Interval: 1.27mm Quantity: 100pcs P100E2: head Shape: Cone Current Rating: 3A Resistance: 50m Ohm Stroke: 6.5mm head Diameter: 1.5mm Probe Tube Diameter: 1.36mm Probe Rod Diameter: 0.99mm Probe Length: 33.3mm Boring Size: 1.7mm Min. Test Interval: 2.54mm Quantity: 100pcs P50B1: P50B1 16mm Pin Centre: 0.68mm Min test distance: 1.27mm Spring Pressure: 75g Full Stroke: 2.65mm Current Rating: 3A Current Resistance: 50mm Plunger: Heat Treated Beryllium Copper Barrel: Phosphor Bronze . Gold Plated Spring: stainless steel P75B1: Specification:spring thimble Needle tube diameter: 1.02mm Needle bar diameter:0.74mm Pin Total Length: 15.8mm Drill size: 1.4mm; Minimum distance between test: 1.91mm Package Included: 100 x Probes .Spring test probes are necessary parts for PCB testing to access components on printed circuit assemblies. There are total 100 pcs spring test probes in one set that you can use for a long time. Cone shape head can be used for testing through‑hole components. Widely used for testing PCB gold fingers(edge connectors) and pads. They are great replacement probes if you need to change broken or old test probes.