Transistor Tester Graphical Resistance Capacitance Checker Test Meters

About this item

• Feature: 1. Automatic detection of NPN and PNP transistors, N?channel and P?channel MOSFET, diodes (including double diodes), thyristors, triodes, resistors and capacitors. 2. Added boot voltage detection function, onekey operation, can automatically test the component pins and display them on the LCD. 3. Can detect the amplification factor and base of transistors, MOSFET protection diodes, etc. to determine the forward bias voltage of the emitter transistor. 4. The display uses LCD(128 x 64 characters), measuring gate threshold voltage and gate capacitance of MOSFET. 5. Higher test speed, within 2 seconds of valid component test, (except for larger capacitors, the measurement of large capacitance takes a long time, the 1 minute measurement time is normal). 6. Power consumption shutdown mode, less than 20 nA, automatic shutdown to avoid unnecessary waste, save battery energy, and improve battery life. Specification: Item Type: Transistor Tester Material: Plastic Color: As Pictures Shown Battery(Not Included): 9V Cascade BatteryManual: 1. Use for ATmega8, for ATmega168 or for microcontrollers. 2. 2x16 character LCD display results. 3. Onekey operation, automatic power off. 4. The shutdown current is 20nA, which supports battery operation. 5. The lowcost version does not require a oscillator and supports automatic poweroff. for ATmega168 or for with 1.05k version software uses sleep mode to reduce power consumption when there is no measurement. 6. Automatic detection of PNP and NPN bipolar transistors, N, Pchannel MOSFET, JFET, diode, double diode, thyristor thyristor. 7. Automatically detect the pin layout. 8. Measure the current amplification factor of the bipolar transistor and the threshold voltage of the emitter junction. 9. Darlington transistors can be identified by high threshold voltage and high current amplification factor. 10. Detection of protection diodes for bipolar transistors and MOSFETs. 11. Measure the threshold voltage and gate capacitance of the MOSFET. 12. Support the measurement and signal display of two resistances, the upper four digits and unit display. Both ends of the displayed resistance signal are the connected tester probe numbers (13). So the potentiometer can also be measured. If the potentiometer is adjusted to one end of it, the tester cannot distinguish the middle and both ends of the pin. 13. The resolution of resistance measurement is 0.1 ohm, and the high measurement value is 50M ohm. 14. A capacitor can be detected and measured. The upper four digits and unit display. The value can be from 25pf (8MHz clock, 50pF@1MHz clock) to 100mF. The resolution can get to 1 pF (@ 8MHz clock). 15. It can be used to measure the equivalent series resistance capacitance value of capacitors above 2UF. The resolution is 0.01 ohms and twodigit values are displayed. This function requires at least 16K flash for ATMEGA (for ATmega168). 16. Show signs of the correct direction for the two diodes. In addition, the forward pressure drop is displayed. 17. The LED is detected as a diode, and the forward voltage drop is much higher than normal. The double LED is detected as a double diode. 18. Zener diode can be detected if the reverse breakdown voltage is lower than 4.5V. This will appear as two diodes and can just be determined by voltage. The signal of the probe surrounding the diode is the same, in this case, you can identify the true anode of the diode by the threshold voltage near 700mV!19. Measure the reverse capacitance of a single diode. Bipolar transistors can also be measured if you connect the base and collector or emitter. 20. Only one measurement is needed to find out the connection of the full bridge. 21. Capacitors with values below 25pf are usually not detected, but they can be connected in parallel with a diode or at least 25pf capacitors in parallel. In this case, you must subtract the part of the parallel capacitance value. 22. Resistance below 2100 ohms will measure inductance, if your for ATMEGA has at least 16K flash memory. The range will exceed 20H from 0:01mH, but the accuracy is not good. The measurement results Only show a single component connection. 23. The test time is about two seconds, Only capacitance and inductance measurements will take a long time. 24. The software can set the number of measurements before the power is automatically turned off. 25. Builtin selfchecking function and optional 50Hz signal to check the clock frequency accuracy and waiting for calling (for ATmega168). 26. Optional equipment calibration port output internal resistance and 0offset selfcheck capability measurement (for ATmega168). Need a 100nF to 20uF capacitor connected between pin 1 and pin 3 to compensate the offset voltage of the analog comparator. This can reduce the measurement error of capacitors above 40uF. The internal correction voltage reference voltage with the same capacitor was found to adjust the gain of the internal reference measurement ADC. If the test current exceeds the holding current, the thyristor and triac can be detected. However, some semiconductor thyristors and triacs have higher trigger currents than the tester can provide. The available test current is Only about 6mA!. Package List: 1 x Transistor Tester Note: All functions are only used for microcontrollers with more program memory such as for ATmega168.Automatic detection of NPN and PNP transistors, N?channel and P?channel MOSFET, diodes (including double diodes), thyristors, triodes, resistors and capacitors. Added boot voltage detection function, onekey operation, can automatically test the component pins and display them on the LCD. Can detect the amplification factor and base of transistors, MOSFET protection diodes, etc. to determine the forward bias voltage of the emitter transistor. The display uses LCD(128 x 64 characters), measuring gate threshold voltage and gate capacitance of MOSFET. Higher test speed, within 2 seconds of valid component test, (except for larger capacitors, the measurement of large capacitance takes a long time, the 1 minute measurement time is normal).